Wafer holder for transmission PL measurements
This design held in place some smaller wafer samples to allow for transmission PL measurements. In this measurement, the light illuminate the sample from the front, and the photoluminescence that is emitted from the back side of the sample is collected by the integrating sphere This holder was designed to be placed on the integrating sphere, with the sample sitting flush against the port. The small rectanguler shape in the figure illustrates the light illumination on the sample.
The transmission-PL sample holder, allowing to position the sample on the integrating sphere and collect PL from the back surface. In this measurement, the sample is illuminating from the back (Green line) and the PL emission (Red) is emitted inside the sphere to be collected.
Configure to allow maximum PL signal reading
The sample was placed so that its face is perpendicular to the illumination. The back side was designed to be as open as possible to allow the PL signal to be collected by the integrating sphere.
